Continuous Level Measurement

Technologies

– RF Admittance
– Ultrasonic Level Measurement
– Radar Level Measurement
– TDR Level Measurement
– Magnetostrictive Level Measurement
– Hydrostatic Pressure Level Measurement

Continuous RF Admittance Level Measurement

The RF Continuous Level Systems provides advanced internal RF-Admittance circuitry that enables the system to ignore significant process coating deposits on the sensors. Over 125 sensing elements are available for applications with process temperature from cryogenic to 537 °C and process pressure from vacuum to 690 Bar